The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2011
Filed:
Aug. 05, 2009
Ichiro Sase, Kanagawa, JP;
Katsuya Watanabe, Kanagawa, JP;
Ichiro Sase, Kanagawa, JP;
Katsuya Watanabe, Kanagawa, JP;
Nikon Corporation, Tokyo, JP;
Abstract
An observation field of view of a microscope can be moved without moving or changing an objective lens and without varying position or state of a sample. A microscope optical system has a mirror that changes the direction of the optical path by reflection and is located in the optical path between an objective lens of the microscope and an image to be observed. The mirror is able to be tilted by changing the position of a reflecting surface of the mirror. Accordingly, the observation field of view is moved by tilting the mirror. In other words, the observation field of view can be moved without changing a positional relationship between the objective lens of the microscope and the sample.