The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2011

Filed:

Oct. 10, 2008
Applicants:

Xiaoyong Liu, Malden, MA (US);

John Mckinley Poole, Maynard, MA (US);

Yufeng Huang, North Chelmsford, MA (US);

Daniel M. Stearns, Canton, MA (US);

Michael J. Gambuzza, Pepperell, MA (US);

Gene Smith Berkowitz, Sudbury, MA (US);

Anthony Kowal, Berlin, MA (US);

Hejie LI, Schenectady, NY (US);

Shawn D. Wehe, Niskayuna, NY (US);

Inventors:

Xiaoyong Liu, Malden, MA (US);

John McKinley Poole, Maynard, MA (US);

Yufeng Huang, North Chelmsford, MA (US);

Daniel M. Stearns, Canton, MA (US);

Michael J. Gambuzza, Pepperell, MA (US);

Gene Smith Berkowitz, Sudbury, MA (US);

Anthony Kowal, Berlin, MA (US);

Hejie Li, Schenectady, NY (US);

Shawn D. Wehe, Niskayuna, NY (US);

Assignee:

GE Infrastructure Sensing, Inc., Billerica, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment of the spectroscopy method, the method comprises the steps of modulating the wavelength of a monochromatic radiation at a modulation amplitude and a modulation frequency; determining a first variable representative of an absorbance of an analyte in a sample; and demodulating by phase-sensitive detection the first variable at a harmonic of the modulation frequency to produce a harmonic spectrum of the analyte. In one embodiment of the spectroscopy apparatus, the apparatus comprises a laser diode integrated with a first photodetector configured to detect an intensity of a backward emission from the laser diode and act as a reference detector; a second photodetector configured to detect an intensity of laser radiation exiting a sample; and electronic circuitry coupled to the laser diode and the photodetectors, configured to acquire and process spectra of the sample. In another embodiment, the spectroscopy apparatus comprises a beam splitter configured to split the laser radiation into a first radiation portion and a second radiation portion and a first photodetector configured to detect the intensity of the first radiation portion.


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