The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7956617 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 07, 2011

Filed:

Jan. 21, 2009
Applicants:

Charles C. Mccarthy, Baltimore, MD (US);

Theodore J. Riccio, Palacios, TX (US);

Inventors:

Charles C. McCarthy, Baltimore, MD (US);

Theodore J. Riccio, Palacios, TX (US);

Assignee:

Northrop Grumman Systems Corporation, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system (S) for testing of electronic circuits () includes at least one input signal () influenced by the tested circuit () for generating a resultant signal () conveying characteristics of selected critical performance parameters from the tested circuit (). A reference circuit () receives comparable test signals () and produces a reference resultant signal (). A comparator block circuit () further generates an output signal () that results from an application of selected comparison criteria to the signals (and). The output signal () is reflective of desired performance of the electronic circuit () that is tested and deterioration with time is detected by analysis and comparison with the results of previous tests.


Find Patent Forward Citations

McCarthy, Charles. (2011). Testing circuits for degradation without removal from host equipment (U.S. Patent No. 7956617). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7956617

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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