The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2011

Filed:

Mar. 28, 2007
Applicants:

Shinya Ogasawara, Niigata, JP;

Shuhei Miura, Niigata, JP;

Akihiko Saito, Niigata, JP;

Tetsuro Takeda, Niigata, JP;

Inventors:

Shinya Ogasawara, Niigata, JP;

Shuhei Miura, Niigata, JP;

Akihiko Saito, Niigata, JP;

Tetsuro Takeda, Niigata, JP;

Assignees:

Niigata University, Niigata, JP;

Denka Seiken Co., Ltd., Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention provides a method for measuring human megalin that can be performed in a simpler manner within a shorter period of time than is possible with conventional techniques, and that can also quantify human megalin. This invention also provides a method that enables diagnosis of functional diseases, which are specific to cells, tissues, or organs, in a site-directed manner at an early stage. Measurement of human megalin enables detection of a disease in an organ in which megalin expression is observed.


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Ogasawara, Shinya. (2011). Method for measuring human megalin (U.S. Patent No. 7955809). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7955809

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