The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2011
Filed:
Aug. 15, 2005
Elina Burla, Kiryat Tivon, IL;
Doron Hess, Haifa, IL;
Alexander Sokulin, Kiryat Tivon, IL;
General Electric Company, Schenectady, NY (US);
Abstract
Methods, apparatus and systems for measuring a thickness of a portion of a multi-layer vessel based on at least one medical diagnostic image frame using an integrated ultrasound device is provided. The method includes for each x-coordinate determining a y-coordinate along an interface between each layer of the vessel including determining a Y coordinate of a center of an intima-media center (IMC) determining the adventitia-media interface Y coordinate, determining the intima-lumen interface Y coordinate, determining for each X coordinate the lumen-intima interface Y coordinate, determining media-adventitia interface Y coordinate, determining a thickness of at least one vessel layer using X and Y coordinates of respective layer interfaces, and outputting the thickness to a display.