The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2011

Filed:

Apr. 13, 2009
Applicants:

Michael Boyd, Saline, MI (US);

Kang LI, Windsor, CA (US);

George Wu, Northville, MI (US);

Inventors:

Michael Boyd, Saline, MI (US);

Kang Li, Windsor, CA (US);

George Wu, Northville, MI (US);

Assignee:

Yazaki North America, Inc., Canton, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 11/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A display for measured quantities can include a gauge with a set of indicia spaced around the gauge to indicate the measured quantities. A window can be formed in the gauge that extends along the set of indicia. An elliptical reflector can be positioned such that a first focus of the elliptical reflector is on the same axis as the center of the gauge with this axis perpendicular to the axis connecting the foci. An optical device can be mounted on a shaft and be arranged to redirect a light beam from a second foci of the elliptical reflector onto the elliptical reflector to generate a virtual pointer in the window. Means can be provided for turning the shaft to rotate the optical device. A light source can project the light beam onto the optical device. Rotation of the optical device can enable the virtual pointer to be selectively aimed at the set of indicia.


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