The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2011

Filed:

Nov. 01, 2010
Applicants:

Jeffrey D. Crouch, Issaquah, WA (US);

Lian L. NG, Bellevue, WA (US);

Mary I. Sutanto, Redmond, WA (US);

Inventors:

Jeffrey D. Crouch, Issaquah, WA (US);

Lian L. Ng, Bellevue, WA (US);

Mary I. Sutanto, Redmond, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B64C 21/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Laminar flow surfaces with selected roughness distributions, and associated methods are disclosed. A representative method for designing an airfoil includes selecting a parameter that includes a flow behavior distribution and/or a surface shape for an airflow surface. Based at least in part on the selected parameter, the method can include (a) selecting a target roughness value and determining a chordwise location forward of which surface roughness is at or below the target roughness value and/or (b) selecting a target chordwise location and determining a roughness value for a region forward of the chordwise location, with the surface roughness at or below the roughness value. In particular embodiments, a percentage of a local chord length of the airfoil over which the roughness is below a target value decreases in a spanwise direction. In another embodiment, the roughness at a particular spanwise location can increase over at least three values, continuously, in a step manner, or otherwise.


Find Patent Forward Citations

Loading…