The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2011
Filed:
Jun. 08, 2007
Applicants:
Kowsik Guruswamy, Sunnyvale, CA (US);
Ajit Sancheti, Cupertino, CA (US);
Inventors:
Kowsik Guruswamy, Sunnyvale, CA (US);
Ajit Sancheti, Cupertino, CA (US);
Assignee:
MU Dynamics, Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method to identify and characterize nonfatal failures of a device-under-analysis (DUA). A security analyzer executes attacks to test the security of the DUA. During the attacks, the security analyzer periodically sends an instrumentation command to the DUA and measures the time the DUA takes to successfully respond to the instrumentation command (the response time sample). The security analyzer uses the response time samples to identify and/or characterize the nonfatal failures in the DUA caused by the attacks.