The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2011
Filed:
Jan. 30, 2008
Tapan Chakraborty, Princeton Junction, NJ (US);
Chen-huan Chiang, Princeton Junction, NJ (US);
Suresh Goyal, Warren, NJ (US);
Michele Portolan, Dublin, IE;
Bradford G. Van Treuren, Lambertville, NJ (US);
Tapan Chakraborty, Princeton Junction, NJ (US);
Chen-Huan Chiang, Princeton Junction, NJ (US);
Suresh Goyal, Warren, NJ (US);
Michele Portolan, Dublin, IE;
Bradford G. Van Treuren, Lambertville, NJ (US);
Alcatel-Lucent USA Inc., Murray Hill, NJ (US);
Abstract
The invention includes an apparatuses and associated methods for controlling dynamic modification of a testing scan path using a control scan path. In one embodiment, an apparatus includes a testing scan path and a control scan path. The testing scan path includes testing components and at least one hierarchy-enabling component. In one embodiment, the control scan path includes at least one control component coupled to the at least one hierarchy-enabling component for controlling dynamic modification of the testing scan path. In one embodiment, the control scan path includes the at least one hierarchy-enabling component, wherein the at least one hierarchy-enabling component is adapted for dynamically modifying the testing scan path using the control scan path. The dynamic modification of the testing scan path may include modifying a hierarchy of the testing scan path, such as selecting or deselecting one or more hierarchical levels of the testing scan path.