The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2011

Filed:

Jul. 26, 2007
Applicants:

AL Chakra, Apex, NC (US);

John F. Sefler, Cary, NC (US);

Teppei Tsurumi, Cary, JP;

Yu Wang, Beijing, CN;

Morgan Louis Johnson, Durham, NC (US);

Inventors:

Al Chakra, Apex, NC (US);

John F. Sefler, Cary, NC (US);

Teppei Tsurumi, Cary, JP;

Yu Wang, Beijing, CN;

Morgan Louis Johnson, Durham, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, system and computer program product for automatically identifying unique language independent keys. A 'key search' is performed which searches for various language independent keys in a properties file associated with a value or text string entered in a first locale. A second locale is suggested to narrow the number of language independent keys displayed in connection with the value entered in the first locale. Upon receiving the value for the second locale, another key search is performed, where this key search is performed on the language independent keys displayed in connection with the first value entered in association with the first locale. A unique language independent key may be identified based on this subsequent key search. By performing key searches and suggesting a second locale to narrow the number of language independent keys, the time in identifying a unique language independent key is reduced and efficiency is improved.


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