The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2011
Filed:
Jul. 09, 2010
Hyun-soo Park, Seoul, KR;
Jae-seong Shim, Seoul, KR;
Jae-wook Lee, Osan-si, KR;
Jung-hyun Lee, Seoul, KR;
Eun-jin Ryu, Suwon-si, KR;
Eing-seob Cho, Yongin-si, KR;
Hyun-soo Park, Seoul, KR;
Jae-seong Shim, Seoul, KR;
Jae-wook Lee, Osan-si, KR;
Jung-hyun Lee, Seoul, KR;
Eun-jin Ryu, Suwon-si, KR;
Eing-seob Cho, Yongin-si, KR;
Samung Electronics Co., Ltd., Suwon-si, KR;
Abstract
An apparatus and method for measuring the quality of a signal on an optical disc based on level information of a viterbi decoder are provided. The signal quality measuring apparatus includes: a binary unit that generates binary signals from input RF signals; a channel identifier that receives the input RF signals and the binary signals output from the binary unit and outputs reference level values corresponding to the binary signals; and an information calculator that receives the reference level values and detects a signal quality value.