The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2011
Filed:
Nov. 14, 2005
Applicants:
Yizhar Weiss, Rishon-LeZion, IL;
Mordekhai Velger, Rehovot, IL;
Sivan Natan-knaz, Kadima, IL;
Raviv Erlich, Rehovot, IL;
Alexander Sromin, Ashdod, IL;
Inventors:
Yizhar Weiss, Rishon-LeZion, IL;
Mordekhai Velger, Rehovot, IL;
Sivan Natan-Knaz, Kadima, IL;
Raviv Erlich, Rehovot, IL;
Alexander Sromin, Ashdod, IL;
Assignee:
Elop Electrooptical Industries Ltd., Rechovot, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of scanning a light beam is disclosed. The method comprises scanning the light beam along a first axis and scanning the light beam along a second axis, such that a functional dependence of the scanning along the first axis is substantially a step-wave, and a functional dependence of the scanning along the second axis is other than a step-wave.