The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2011
Filed:
Mar. 26, 2008
Applicants:
Xiaojun Chen, San Gabriel, CA (US);
Lianshan Yan, Sichuan, CN;
Xiaotian Steve Yao, Diamond Bar, CA (US);
Inventors:
Xiaojun Chen, San Gabriel, CA (US);
Lianshan Yan, Sichuan, CN;
Xiaotian Steve Yao, Diamond Bar, CA (US);
Assignee:
General Photonics Corporation, Chino, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems, apparatus and methods for characterizing linear retarders using a waveplate analyzer constructed by polarization rotators. In one implementation of such an analyzer, both the retardation of the waveplate sample and the orientation of optical axis of the waveplate sample can be simultaneously measured.