The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2011
Filed:
Jan. 07, 2009
Bernd Friedrich, Hasloh, DE;
Jan-gerd Frerichs, Norderstedt, DE;
Eike Kortz, Bielefeld, DE;
Kruess GmbH Wissenschaftliche Laborgerate, Hamburg, DE;
Abstract
A drop on a sample surface in a gaseous environment has a curved surface with a symmetry axis and a defined volume. To determine the contact angle, an object is imaged based on the reflection property of the surface of the drop, the position of the object with respect to the optical axis of an optical measuring system and the position of the object with respect to the sample surface, with the symmetry axis of the drop being arranged in or in the vicinity of the optical axis. The distance between the image and the optical axis of the drop is measured. The radius of curvature of the drop is determined based on the measured distance, and the contact angle is determined from the radius of curvature.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile