The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2011

Filed:

Nov. 04, 2010
Applicants:

Douglas E. Crafts, Los Gatos, CA (US);

Jinxi Shen, San Ramon, CA (US);

Philip Duggan, Ottawa, CA;

James F. Farrell, San Jose, CA (US);

Barthelemy Fondeur, San Jose, CA (US);

Eliseo Ranalli, Irvine, CA (US);

Inventors:

Douglas E. Crafts, Los Gatos, CA (US);

Jinxi Shen, San Ramon, CA (US);

Philip Duggan, Ottawa, CA;

James F. Farrell, San Jose, CA (US);

Barthelemy Fondeur, San Jose, CA (US);

Eliseo Ranalli, Irvine, CA (US);

Assignee:

JDS Uniphase Corporation, Milpitas, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scanning optical spectrometer with a detector array is disclosed, in which position of focused spot of light at the input of a dispersive element such as arrayed waveguide grating (AWG) with a slab input, is scanned using a micro-electro-mechanical (MEMS) tiltable micromirror so as to make the dispersed spectrum of light scan over the detector array coupled to the AWG. Sub-spectra recorded using individual detectors are concatenated by a processor unit to obtain the spectrum of input light.


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