The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2011

Filed:

Jun. 21, 2005
Applicants:

Anne Ferreol, Colombes, FR;

Pascal Larzabal, L'Hay les Roses, FR;

Inventors:

Anne Ferreol, Colombes, FR;

Pascal Larzabal, L'Hay les Roses, FR;

Assignee:

Thales, , FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 5/04 (2006.01); G01S 3/80 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method of multi-parameter direction finding of several sources in an array of N sensors, comprising at least the following steps: a) choosing a parameter to be determined, or parameter of interest, b) expressing the direction vector in the form of a linear relation between the parameter of interest chosen and the secondary parameters b(θ, Φ)=U(θ) φ(Φ), c) applying a MUSIC-type direction finding step by factorizing the criterion serving for the determination of the angles of incidence so as to determine at least the incidence parameter, d) on the basis of the incidence value, determining the vector representative of the secondary parameters and expressing this vector in the form of a linear relation between a chosen parameter to be determined and the other secondary parameters, e) applying a MUSIC-type direction finding step by factorizing the criterion serving in the determination of the chosen parameter, f) repeating steps d) to e) so as to determine the majority or the whole set of secondary parameters.


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