The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2011

Filed:

Jun. 26, 2009
Applicants:

William Richard Eisenstadt, Gainesville, FL (US);

Jae Shin Kim, Tempe, AZ (US);

Inventors:

William Richard Eisenstadt, Gainesville, FL (US);

Jae Shin Kim, Tempe, AZ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03H 11/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

Phase noise detection systems for a device under test (DUT) are provided that can be embedded within a chip. According to one embodiment, the embedded phase noise detection system can include an active delay line cell, a phase shifter, and a phase detector. The active delay line and phase shifter separately receive the output signal of the DUT. The phase detector can include a double-balanced mixer followed by an active RC filter. The double-balanced mixer receives, as input, the outputs from the active delay line and phase shifter and can produce different dc voltages proportional to the difference from the input phase quadrature. An auto-adjustment circuit can also be included to help the input signal from the phase shifter to the mixer maintain quadrature.


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