The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2011

Filed:

Aug. 28, 2008
Applicants:

Zunhang Yu Kasnavi, Sunnyvale, CA (US);

Chung Fu, Sunnyvale, CA (US);

Ramraj Gottiparthy, Sunnyvale, CA (US);

Inventors:

Zunhang Yu Kasnavi, Sunnyvale, CA (US);

Chung Fu, Sunnyvale, CA (US);

Ramraj Gottiparthy, Sunnyvale, CA (US);

Assignee:

Altera Corporation, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and apparatus are disclosed related to testing and testability of adaptive equalization circuitry. Where an equalization circuit is provided in an IC, a modified internal loopback provides a testing signal. A local comparator circuit with flexible connectivity offers analog signal testing analysis in conjunction with a low-cost external tester. Flexible use and connectivity of the comparator and external connection points, and block isolation circuitry make accurate, faster, and lower cost testing methods possible.


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