The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2011
Filed:
Jan. 12, 2007
Hirofumi Shimada, Takasaki, JP;
Takashi Nakano, Maebashi, JP;
Takuro Sakai, Takasaki, JP;
Kazuo Arakawa, Takashi, JP;
Mitsuhiro Fukuda, Takasaki, JP;
Masakazu Oikawa, Takasaki, JP;
Takahiro Satoh, Takasaki, JP;
Takashi Agematsu, Takasaki, JP;
Ken Yusa, Maebashi, JP;
Hiroyuki Katoh, Maebashi, JP;
Shoji Kishi, Maebashi, JP;
Taku Sato, Maebashi, JP;
Yasushi Horiuchi, Maebashi, JP;
Hirofumi Shimada, Takasaki, JP;
Takashi Nakano, Maebashi, JP;
Takuro Sakai, Takasaki, JP;
Kazuo Arakawa, Takashi, JP;
Mitsuhiro Fukuda, Takasaki, JP;
Masakazu Oikawa, Takasaki, JP;
Takahiro Satoh, Takasaki, JP;
Takashi Agematsu, Takasaki, JP;
Ken Yusa, Maebashi, JP;
Hiroyuki Katoh, Maebashi, JP;
Shoji Kishi, Maebashi, JP;
Taku Sato, Maebashi, JP;
Yasushi Horiuchi, Maebashi, JP;
National University Corporation Gunma University, Gunma, JP;
Japan Atomic Energy Agency, Ibaraki, JP;
Abstract
A subject is imaged for treatment of the subject such as an eye to be inspected, while irradiating a charged particle beam on the eye, so that an aim position of a charged particle beam for treatment can be determined. The device for determining an aim position of a charged particle beam includes a range adjusterthat adjusts an irradiation position, in a depth direction of the eye, of a charged particle beam irradiated from a charged particle beam source, a mirrorthat transmits or passes the position determining charged particle beam and reflects an emitted light emitted from a region of the eye on which the charged particle beam is irradiated and an emitted light emitted, due to an irradiated of an excitation light, from a region including the region of the eye on which the position determining charged particle beam, toward the outside of the axis of the charged particle beam, and an eyeground imaging devicethat is arranged at a position where the emitted lights reflected from the mirror are incident and images the region including the region of the eye on which the charged particle beam is irradiated by causing the emitted lights to be incident, so that it allows to determine an aim position of a charged particle beam for treatment based on a imaged image.