The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2011
Filed:
Jul. 11, 2007
Bernd Roesicke, Mannheim, DE;
Stefan Kalveram, Viernheim, DE;
Frederic Wehowski, Hockenheim, DE;
Michael Goetz, Reichelsheim, DE;
Bernd Roesicke, Mannheim, DE;
Stefan Kalveram, Viernheim, DE;
Frederic Wehowski, Hockenheim, DE;
Michael Goetz, Reichelsheim, DE;
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Abstract
The invention relates to embodiments of an analysis system and to a method for analyzing a sample on an analytical test element, with the analysis system comprising a test element receptacle for receiving and positioning a test element in an analysis position. In an exemplary embodiment, the test element receptacle contains a guide part and a lock part, the guide part having means for guiding a test element into and out of the analysis position, the lock part comprising a frame and a bolt element, which frame and bolt element are connected to one another by a hinge. The bolt element can be pivoted about the hinge between a first position and a second position with respect to the frame. The bolt element comprises a latching lug for engaging in a recess in test element when the bolt element is in the first position and when the test element is positioned in the analysis position.