The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2011

Filed:

Mar. 09, 2007
Applicants:

Takashi Ozaki, Hachioji, JP;

Koichi Tashiro, Sagamihara, JP;

Masaya Fujita, Sagamihara, JP;

Masakazu Gotanda, Kanagawa, JP;

Akinobu Uchikubo, Iruma, JP;

Takeaki Nakamura, Hino, JP;

Inventors:

Takashi Ozaki, Hachioji, JP;

Koichi Tashiro, Sagamihara, JP;

Masaya Fujita, Sagamihara, JP;

Masakazu Gotanda, Kanagawa, JP;

Akinobu Uchikubo, Iruma, JP;

Takeaki Nakamura, Hino, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); A61B 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

An object observation method and system including an endoscope, at least one treating device, a first detecting portion for detecting information indicating an observation direction of the endoscope, a second detecting portion for detecting information indicating a treatment direction of the treating device, a three dimensional virtual image data storing portion for storing three dimensional image data prepared in advance, a virtual image data processing portion for creating virtual image data based on the information indicating the observation direction and the treatment direction, first and second three dimensional image display monitors, each having first and second image display devices, and switch sections for instructing change of display mode of the second image display devices.


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