The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2011

Filed:

Jan. 21, 2005
Applicants:

François Lacombe, Chaville, FR;

David Lafaille, Meudon, FR;

Inventors:

François Lacombe, Chaville, FR;

David Lafaille, Meudon, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a device, for measuring the contrast of fringes in a Michelson interferometer at full field, comprising a Wollaston prism for diverting two perpendicular incident polarizations into two different emergent directions, said diverting means being arranged within the interferometer as substitute for a single polarizer. The device is of application to a Michelson interferometer used in an OCT tomographical system and comprising means for obtaining interferometric contrast without use of a modulation technique or synchronous detection methods.


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