The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2011
Filed:
Jul. 24, 2008
Steven Michael Douskey, Rochester, MN (US);
Michael John Hamilton, Rochester, MN (US);
Brandon Edward Schenck, Rochester, MN (US);
Steven Michael Douskey, Rochester, MN (US);
Michael John Hamilton, Rochester, MN (US);
Brandon Edward Schenck, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An adaptation of standard boundary cell architecture defined by the IEEE 1149.1 Joint Test Action Group (JTAG) interface standard to provide paths to functional circuitry via the re-use of JTAG standard test data registers (TDR) and interface. Existing multi-core processor solutions are covered, but an expansion for a more generic solution is provided. In general, an integrated circuit is provided with a plurality of function registers along with a plurality of I/O units. The I/O units are arranged in a serial communications chain located around the boundary of the integrated circuit's functional circuitry. Each of the I/O units include JTAG standard serial TDR in serial communication with adjacent I/O units. Moreover, each I/O unit includes JTAG standard parallel TDR that is associated with and in parallel communication with the I/O unit's JTAG standard serial TDR. Further still, a digital logic interface is configured to control the direct transfer of data between the JTAG standard parallel TDR and a corresponding one of the plurality of function registers. As a result of the re-use of existing boundary scan architecture, a significant reduction in wiring congestion is realized. Thus, asynchronous communication is provided without sacrificing valuable integrated circuit real estate.