The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2011
Filed:
Jul. 17, 2008
Peng Chen, Shenzhen, CN;
Yao Zhao, Shenzhen, CN;
Hua-dong Cheng, Shenzhen, CN;
Wen-chuan Lian, Taipei Hsien, TW;
Han-che Wang, Taipei Hsien, TW;
Kuan-hong Hsieh, Taipei Hsien, TW;
Peng Chen, Shenzhen, CN;
Yao Zhao, Shenzhen, CN;
Hua-Dong Cheng, Shenzhen, CN;
Wen-Chuan Lian, Taipei Hsien, TW;
Han-Che Wang, Taipei Hsien, TW;
Kuan-Hong Hsieh, Taipei Hsien, TW;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;
Abstract
An electronic apparatus testing method is provided. The method includes the step of: reading a product ID of the electronic apparatus when the electronic apparatus is connected to a control apparatus; determining the device type ID from the product ID, wherein the product ID comprises basic information of the electronic apparatus, determining the script files of the functions of the electronic apparatus in the testing table according to the device type ID; obtaining the script files from a data storage and running the script files to test functions of the electronic apparatuses, sending a control instruction to the corresponding measuring device of the function to control the measuring device test the function during the process of running the script files; and displaying test results through a display of the control apparatus.