The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2011

Filed:

Dec. 08, 2006
Applicants:

Karthik Pattabiraman, Urbana, IL (US);

Vinod K. Grover, Mercer Island, WA (US);

Benjamin G. Zorn, Woodinville, WA (US);

Inventors:

Karthik Pattabiraman, Urbana, IL (US);

Vinod K. Grover, Mercer Island, WA (US);

Benjamin G. Zorn, Woodinville, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 13/00 (2006.01); G06F 13/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Typical computer programs may incur costly memory errors that result in corrupted data. A new memory model is presented wherein it may be determined that certain data is critical and critical data may be stored and protected during computer application execution. Critical Memory allows that data determined to be critical may be stored and retrieved using functions enabled to increase the reliability of the data. Functions are presented enabling allocation of redundant computer memory; functions are presented enabling consistently writing critical data to redundant locations; and functions are presented enabling reading critical data while ensuring that the data read is consistent with the most recent write of critical data and enabled to repair inconsistent data. The memory model and functions presented are designed to be compatible with existing third-party libraries.


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