The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2011
Filed:
Oct. 12, 2007
Rong Xiao, Beijing, CN;
Xiaoou Tang, Beijing, CN;
Rong Xiao, Beijing, CN;
Xiaoou Tang, Beijing, CN;
Microsoft Corporation, Redmond, WA (US);
Abstract
An efficient, effective and at times superior object detection and/or recognition (ODR) function may be built from a set of Bayesian stumps. Bayesian stumps may be constructed for each feature and object class, and the ODR function may be constructed from the subset of Bayesian stumps that minimize Bayesian error for a particular object class. That is, Bayesian error may be utilized as a feature selection measure for the ODR function. Furthermore, Bayesian stumps may be efficiently implemented as lookup tables with entries corresponding to unequal intervals of feature histograms. Interval widths and entry values may be determined so as to minimize Bayesian error, yielding Bayesian stumps that are optimal in this respect.