The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2011

Filed:

Jul. 31, 2008
Applicant:

Malay K. Ganai, Plainsboro, NJ (US);

Inventor:

Malay K. Ganai, Plainsboro, NJ (US);

Assignee:

NEC Laboratories America, Inc., Princeton, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/445 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for bounded model checking of computer programs includes providing a program having at least one reachable property node. The program is decomposed for bounded model checking (BMC) into subproblems by creating a tunnel based on disjunctive control paths through the program. A reduced BMC sub-problem obtained using BMC unrolling, while using path constraints imposed by the at least one tunnel. For the reachable property node, determining a quantifier-free formula (QFP) in a decidable subset of first order logic. Satisfiability of the QFP is checked, independently and individually, to determine whether the QFP is satisfiable for the subproblem. The decomposing is continued until the a BMC bound is reached.


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