The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2011

Filed:

Oct. 02, 2008
Applicants:

Aaron Michael Burry, Ontario, NY (US);

Kenny-tuan T. Dinh, Webster, NY (US);

Karl E. Kurz, Rochester, NY (US);

Bruce E. Thayer, Webster, NY (US);

Michael F. Zona, Holley, NY (US);

Inventors:

Aaron Michael Burry, Ontario, NY (US);

Kenny-tuan T. Dinh, Webster, NY (US);

Karl E. Kurz, Rochester, NY (US);

Bruce E. Thayer, Webster, NY (US);

Michael F. Zona, Holley, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01); G03G 15/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A xerographic marking engine adjusts a charging actuator value, such as an AC peak-to-peak voltage or an AC peak-to-peak current, based on a determined knee value, V, of a charge curve for an imaging apparatus photoreceptor within the xerographic marking engine and environmental sensor data. The environmental sensor data may measure environment temperature and environment humidity. In near A-zone environments, for example, operational environments in which the temperature is 80 degrees Fahrenheit and the relative humidity is 80%, the charging actuator value may be selected to achieve a predetermined photoreceptor wear rate that avoids print quality defects due to lateral charge migration. In other than A-zone environments, the charging actuator value may be selected to minimize the photoreceptor wear rate, while avoiding print quality defects. The described approach allows optimal photoconductor wear to be achieved, in all operational environments, without increasing the risk of print quality defects.


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