The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7948847 B1

PDF
Full Text
Expired
Date of Patent:
May. 24, 2011

Filed:

Feb. 12, 2008
Applicants:

Yamasaki Yukihiro, Suwon-si, KR;

Kagimoto Tomohiro, Suwon-si, KR;

Tasaka Shuichi, Suwon-si, KR;

Ji Seon Baek, Suwon-si, KR;

Inventors:

Yamasaki Yukihiro, Suwon-si, KR;

Kagimoto Tomohiro, Suwon-si, KR;

Tasaka Shuichi, Suwon-si, KR;

Ji Seon Baek, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method to write/reproduce data to/from an optical disc, which are capable of preventing an error from occurring at the time of examination of a writing strategy and searching for an optimum writing condition for a short period of time, by examining the writing strategy after adjusting a focus in a test region, in order to set a writing condition at the time of writing data. The apparatus to write/reproduce data to/from an optical disc includes a matrix jitter measuring unit which measures length errors and jitters of edges of a mark and a space of a written data pattern from an RF signal generated at the time of reproduction of the optical disc; and a CPU which extracts at least one of the RF signal, a jitter and an error rate, controls a focus bias, and performs an optimum power calibration (OPC) for searching for optimum power of laser.


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