The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2011

Filed:

May. 27, 2008
Applicants:

Brian R. Conrow, Webster, NY (US);

Patricia J. Donaldson, Pittsford, NY (US);

Fan Shi, Penfield, NY (US);

William B. Willard, Fairport, NY (US);

David C. Craig, Pittsford, NY (US);

Inventors:

Brian R. Conrow, Webster, NY (US);

Patricia J. Donaldson, Pittsford, NY (US);

Fan Shi, Penfield, NY (US);

William B. Willard, Fairport, NY (US);

David C. Craig, Pittsford, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/00 (2006.01); G06K 9/00 (2006.01); H04N 1/60 (2006.01); H04N 1/46 (2006.01); G03F 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A marking device is controlled to mark a media sheet with halftone dots selected from a set of image halftone dot representations. The marking device is controlled to mark a monitored surface with halftone dots selected from a set of control halftone dot representations to form test patches of different nominal marking densities. Measured marking densities are acquired using a density sensor for the test patches marked on the monitored surface. The set of control halftone dot representations is updated based on the measured marking densities and the nominal marking densities.


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