The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2011
Filed:
Jan. 23, 2007
Kazuo Hotate, Tokyo, JP;
Kwang Yong Song, Tokyo, JP;
Zuyuan He, Tokyo, JP;
The University of Tokyo, Tokyo, JP;
Yokogawa Electric Corporation, Tokyo, JP;
Abstract
A measurement precision is improved and a measurement range is extended by efficiently suppressing a noise level of integrated unnecessary components from non-correlation positions. Measuring meansdetects the Brillouin gain of a probe light output from a measurement-target optical fiber FUT while sweeping a frequency difference between the pump light and the probe light, and measures the distribution of strains of the measurement-target optical fiber FUT. An optical intensity modulatorperforms intensity modulation on output light in synchronization with frequency modulation performed on a light source. Accordingly, the spectrum distribution with respect to the frequency of light from the light sourcecan be adjusted arbitrarily, and a noise spectrum shape generated at a position other than a correlation peak position and spreading over a frequency axis can be adjusted, and the peak frequency of a Lorentz spectrum generated at the correlation peak position can be measured precisely. Moreover, a measurement range dcan be extended.