The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2011
Filed:
Apr. 03, 2007
Frank Klefenz, Mannheim, DE;
Johannes Katzmann, Waltha-Farnroda, DE;
Christian Holland-nell, Steinbach-Hallenberg, DE;
Peter Husar, Homburg, DE;
Frank Klefenz, Mannheim, DE;
Johannes Katzmann, Waltha-Farnroda, DE;
Christian Holland-Nell, Steinbach-Hallenberg, DE;
Peter Husar, Homburg, DE;
Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V., Munich, DE;
Technische Universitaet e.V., Ilmenau, DE;
Abstract
An apparatus for determining information about shape and location of an ellipse involves determining two coordinates of a first ellipse point representing a point of the ellipse located furthest in the first direction, and determining two coordinates of a second ellipse point representing a point of the ellipse located furthest in a direction opposite to the first direction. The apparatus determines parameters of bent line segments approximating the ellipse at ellipse points or in a surrounding of ellipse points, and determines the coordinates of ellipse points based on the parameters of the bent line segments. The apparatus involves calculating ellipse parameters of the ellipse based on the two coordinates of the first ellipse point and the two coordinates of the second ellipse point. The apparatus enables real-time-capable determination of parameters of an ellipse included in an image to be analyzed.