The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2011
Filed:
Oct. 23, 2007
Petr Stluka, Prague, CZ;
Roman Navratil, Prague, CZ;
Petr Stluka, Prague, CZ;
Roman Navratil, Prague, CZ;
Honeywell International Inc., Morristown, NJ (US);
Abstract
Deviations associated with a process system are identified, such as by identifying deviations of process variables or production measurements from target values. A graphical display is generated that identifies at least some of the deviations and one or more characteristics associated with the deviations. For example, the graphical display includes a time axis, and each deviation is associated with a bar positioned in the graphical display to identify a start time and an end time of the deviation along the time axis. Also, each bar may include one or more indicators (such as patterns, colors, or shadings) that identify the one or more characteristics (such as an economic impact and/or a cause) of each deviation identified in the graphical display. In this way, a user can, among other things, identify when deviations from target values occur, durations of the deviations, and economic impacts and/or causes associated with the deviations.