The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2011

Filed:

Oct. 01, 2008
Applicant:

Emi Ohtsuka, Toyama, JP;

Inventor:

Emi Ohtsuka, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/76 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of production of a semiconductor device includes: forming a pattern having open element isolation regions on a first insulating film situated on a semiconductor substrate; forming trenches at the element isolation regions on the semiconductor substrate; forming a second insulating film on the first insulating film and inside the trenches; forming holes in the second insulating film in active regions sectioned by the element isolation regions; and leaving the second insulating film inside the trenches only. An interval between an outer perimeter of each the active regions and an outer perimeter of each of the holes in each of the active regions is set such that the interval in the first circuit region, in which a total area of the active regions is relatively large, is smaller than the interval in the second circuit region, in which the total area of the active regions is relatively small.


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