The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2011

Filed:

Nov. 24, 2008
Applicants:

Harry Lester Kington, Scottsdale, AZ (US);

Surendra Singh, Chandler, AZ (US);

Mark C. Morris, Phoenix, AZ (US);

Inventors:

Harry Lester Kington, Scottsdale, AZ (US);

Surendra Singh, Chandler, AZ (US);

Mark C. Morris, Phoenix, AZ (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01H 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of detecting a deviation angle in a single-crystal metal structure is disclosed. The single-crystal metal structure has a crystallographic orientation, a length, a first side, a second side, and a first axis extending through the structure. The method comprises determining the length of the single-crystal metal structure along the first axis, transmitting a signal through the single-crystal metal structure from the first side, the signal oriented to propagate along the first axis, receiving the signal, determining a time-of-flight for the signal to traverse the length from the first side to the second side, determining a speed of the signal based on the time-of-flight and the length, and comparing the speed of the signal to a reference speed to detect the deviation angle.


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