The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2011
Filed:
Sep. 13, 2005
Igor Getman, Lörrach, DE;
Armin Wernet, Rheinfelden, DE;
Roland Dieterle, Lörrach, DE;
Kaj Uppenkamp, Wehr, DE;
Igor Getman, Lörrach, DE;
Armin Wernet, Rheinfelden, DE;
Roland Dieterle, Lörrach, DE;
Kaj Uppenkamp, Wehr, DE;
Endress + Hauser GmbH + Co. KG, Maulburg, DE;
Abstract
A method for manufacturing-side calibration of a measuring device for capacitive fill level measurement of a medium, wherein at least one probe unit of the measuring device is activated with an electrical, alternating voltage of a predeterminable frequency. As a function of the frequency of the activating signal, a conductivity range is determined, within which the fill level measurement is essentially independent of a change of the electrical conductivity of the medium; for such conductivity range, at least a first reference matching between a predeterminable, first fill-level value and a first capacitance value belonging to the first fill-level value is produced; and the first reference matching between the first fill-level value and the first capacitance value is recorded. Additionally, the invention relates to a corresponding measuring device.