The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2011

Filed:

Jun. 12, 2006
Applicants:

Masahiro Ohishi, Itabashi-ku, JP;

Yoshikatsu Tokuda, Itabashi-ku, JP;

Fumio Ohtomo, Itabashi-ku, JP;

Inventors:

Masahiro Ohishi, Itabashi-ku, JP;

Yoshikatsu Tokuda, Itabashi-ku, JP;

Fumio Ohtomo, Itabashi-ku, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 5/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

In measuring a certain time lag between generations of two pulse signals, a time lag measuring device prevents errors in measurement results even with an error in two reference signals for measuring the time lag. The device measures a time lag between a start signal Mand a stop signal Mand includes a reference signal generating sectiongenerating two reference signals S, Shaving a phase difference π/2, and an amplitude detecting sectiondetects amplitudes A, Aand A, Aof the reference signals S, Sat generation timings for the start signal Mand the stop signal M, a phase difference detecting sectioncalculating a phase _ of the reference signals S according to each set of the amplitudes (A, A) and (A, A), and a correcting sectioncorrecting the calculated phase using correction data for error correction in the reference signals S, S


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