The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2011
Filed:
Sep. 21, 2010
John Douglas Birdwell, Oak Ridge, TN (US);
Tse-wei Wang, Oak Ridge, TN (US);
Dale V. Stansberry, Knoxville, TN (US);
Jared Pendleton, Knoxville, TN (US);
John Douglas Birdwell, Oak Ridge, TN (US);
Tse-Wei Wang, Oak Ridge, TN (US);
Dale V. Stansberry, Knoxville, TN (US);
Jared Pendleton, Knoxville, TN (US);
University of Tennessee Research Foundation, Knoxville, TN (US);
Abstract
An item is organized and presented by displaying a table, wherein the table displays a plurality of data comprising DNA profile analysis results including an observation characterizing the at least one item, and wherein an analysis result is based on a decision made by an expert system according to a rule base. An observation comprises one of concordance, a locus having a concordance error, an off-ladder peak, a peak height imbalance and a peak falling in an overlap region between loci. The rule base comprises rules related to background noise, spike, broad peak, duplicate allele, bleed-through peak, pull-up peak, stutter peak, −A peak and global filter rules.