The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7945444 B1

PDF
Full Text
Expired
Date of Patent:
May. 17, 2011

Filed:

Sep. 08, 2008
Applicants:

Jiri Navratil, White Plains, NY (US);

Ganesh N. Ramaswamy, Ossining, NY (US);

Inventors:

Jiri Navratil, White Plains, NY (US);

Ganesh N. Ramaswamy, Ossining, NY (US);

Assignee:

Nuance Communications, Inc., Burlington, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G10L 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In detection systems, such as speaker verification systems, for a given operating point range, with an associated detection 'cost', the detection cost is preferably reduced by essentially trading off the system error in the area of interest with areas essentially 'outside' that interest. Among the advantages achieved thereby are higher optimization gain and better generalization. From a measurable Detection Error Tradeoff (DET) curve of the given detection system, a criterion is preferably derived, such that its minimization provably leads to detection cost reduction in the area of interest. The criterion allows for selective access to the slope and offset of the DET curve (a line in case of normally distributed detection scores, a curve approximated by mixture of Gaussians in case of other distributions). By modifying the slope of the DET curve, the behavior of the detection system is changed favorably with respect to the given area of interest.


Find Patent Forward Citations

Navratil, Jiri. (2011). Optimization of detection systems using a detection error tradeoff analysis criterion (U.S. Patent No. 7945444). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7945444

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