The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2011

Filed:

Jan. 31, 2006
Applicants:

John Mount, San Francisco, CA (US);

Amir Ashkenazi, Los Altos, CA (US);

Daniel Klein, Alameda, CA (US);

Teg Grenager, San Francisco, CA (US);

Inventors:

John Mount, San Francisco, CA (US);

Amir Ashkenazi, Los Altos, CA (US);

Daniel Klein, Alameda, CA (US);

Teg Grenager, San Francisco, CA (US);

Assignee:

Shopping.com, Brisbane, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for using automated translation and other statistical methods to convert a classifier in one language to another language are provided. In one embodiment of the invention, a method preferably includes marking target language examples of passages of text in order to obtain an initial classifier in the target language, re-classifying a plurality of target language examples in the initial classifier, and then questioning—i.e., determining the validity—of the marking used to obtain the initial classifier. Preferably, the questioning is based on the re-classifying. Then, preferably following the questioning, the method isolates a high-quality set of target examples based on the results of the questioning. Finally, the method uses the high-quality set of target examples to prepare a high-quality classifier in the target language.


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