The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2011
Filed:
May. 22, 2010
Timothy J. Kostyk, Louisville, KY (US);
Theresa C. Kratschmer, Yorktown Heights, NY (US);
Jeff R. Layton, New York, NY (US);
Peter Kenneth Malkin, Ardsley, NY (US);
Stephen G. Perun, Evans, GA (US);
Kenneth L. Pyra, Cave Creek, AZ (US);
Padmanabhan Santhanam, Yorktown Heights, NY (US);
John C. Thomas, Yorktown Heights, NY (US);
Scott W. Weller, Penfield, NY (US);
Timothy J. Kostyk, Louisville, KY (US);
Theresa C. Kratschmer, Yorktown Heights, NY (US);
Jeff R. Layton, New York, NY (US);
Peter Kenneth Malkin, Ardsley, NY (US);
Stephen G. Perun, Evans, GA (US);
Kenneth L. Pyra, Cave Creek, AZ (US);
Padmanabhan Santhanam, Yorktown Heights, NY (US);
John C. Thomas, Yorktown Heights, NY (US);
Scott W. Weller, Penfield, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer-implemented method of optimizing at least one of a design, production and testing process in a mass manufacturing process includes steps of: collecting error data relating to a product; classifying the error data into categories of symptoms; mapping the symptom to a revealing condition of the product; mapping the revealing condition to a test type; mapping a scope of a fix to phases of error injection mapping; and recommending modifications to an end user for at least one of the design, production, delivery, and testing process based on the scope of the fix.