The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2011

Filed:

Jan. 10, 2007
Applicant:

Kouichirou Hirao, Kakegawa, JP;

Inventor:

Kouichirou Hirao, Kakegawa, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A line segment detector comprises a vertical line detecting part, a horizontal line detecting part, a left-to-right downward slanting line detecting part, a left-to-right upward slanting line detecting part, and a line-segment detecting/synthesizing section that calculates OR operation of output values from the vertical line detecting part, the horizontal line detecting part, the left-to-right downward slanting line detecting part, and the left-to-right upward slanting line detecting part. The line segment detector further comprises a re-determining unit comprising a second line-segment detecting part that sets a window to the detection result near the target pixel, counts the number of pixels whose detection result is determined as the line segment in the set window, determines, when the counted value is not smaller than a predetermined threshold value, that the pixel is a line segment.


Find Patent Forward Citations

Hirao, Kouichirou. (2011). Line segment detector and line segment detecting method (U.S. Patent No. 7945095). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7945095

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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