The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2011

Filed:

Feb. 14, 2008
Applicants:

Taiga Goto, Tokyo, JP;

Koichi Hirokawa, Tokyo, JP;

Toshiyuki Irie, Ibaraki, JP;

Inventors:

Taiga Goto, Tokyo, JP;

Koichi Hirokawa, Tokyo, JP;

Toshiyuki Irie, Ibaraki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An X-ray CT apparatus acquires a scanogram of an object to be examined, generates an ellipse model having an X-ray attenuation coefficient equivalent to that of water and approximated to a tomographic image of the obtained imaged portion from the feature quantity of the projection value profile, determines whether or not the generated elliptic model is adequate as a model of the imaged portion from another feature quantity with respect to the projection value profile, generates a corrected elliptic model according to yet another feature quantity with respect to the projection value profile if the elliptic model is determined to be inadequate, and controls the modulation of the tube current in an X-ray source so that a predetermined target SD value is maintained in any scanning position when a tomographic image is reconstructed according to X-rays transmitted through the object by using the elliptic model or the corrected elliptic model.


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