The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2011

Filed:

Feb. 14, 2007
Applicants:

Yun-ju Kwon, Suwon-si, KR;

Su-jin Yoon, Suwon-si, KR;

Inventors:

Yun-Ju Kwon, Suwon-si, KR;

Su-Jin Yoon, Suwon-si, KR;

Assignee:

Qualcomm Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a method for detecting a frequency offset in an Orthogonal Frequency Division Multiplexing (OFDM) system. The method includes determining a first frequency index based on autocorrelation values calculated according to a frequency index for a pilot signal of a received symbol, accumulating the autocorrelation values calculated according to the frequency index for the pilot signal of the received symbol depending on a symbol count, and determining a second frequency index based on the accumulated autocorrelation values, and determining at least one of the first frequency index and the second frequency as a frequency offset according to channel quality.


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