The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2011

Filed:

Jan. 09, 2007
Applicant:

Yasuhiro Yamasaki, Tokyo, JP;

Inventor:

Yasuhiro Yamasaki, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A communication quality measuring device includes: a quality measuring unit that measures the communication quality of a transmission path, based on data being transmitted through the transmission path; an observation time calculating unit that calculates a time interval for securing an observation time for the quality measuring unit; and a measurement triggering unit that causes the quality measuring unit to start measurement at the time interval calculated by the observation time calculating unit. The observation time is the time required for maintaining predetermined measurement accuracy in the communication quality measured by the quality measuring unit.


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