The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2011

Filed:

Jul. 25, 2006
Applicants:

Ryo Nemoto, Kokubunji, JP;

Hiroshi Yoshigi, Hinode, JP;

Yoshiaki Yazawa, Nishitokyo, JP;

Kazuki Watanabe, Hino, JP;

Inventors:

Ryo Nemoto, Kokubunji, JP;

Hiroshi Yoshigi, Hinode, JP;

Yoshiaki Yazawa, Nishitokyo, JP;

Kazuki Watanabe, Hino, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 1/08 (2006.01); G08B 13/14 (2006.01); H04Q 5/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an RFID system including RFID tags each incorporating a sensor, accuracy of measurement by the sensor can be improved. For example, when measurements are performed several times by using RFID tags each incorporating a sensor unit, generation of a carrier directed from an RFID reader/writer to the RFID tags is stopped for a predetermined period every time when a measurement ends. By this means, the chip temperature of the RFID tag increased due to power consumption in each measurement can be reduced to, for example, ambient temperature every time when a measurement ends. Therefore, an error in measurement by the sensor unit can be reduced, thereby achieving accurate measurement.


Find Patent Forward Citations

Loading…