The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2011

Filed:

Jan. 22, 2008
Applicants:

Igor I. Smolyaninov, Columbia, MD (US);

Yu-ju Hung, Fremont, CA (US);

Christopher C. Davis, Bowie, MD (US);

Inventors:

Igor I. Smolyaninov, Columbia, MD (US);

Yu-Ju Hung, Fremont, CA (US);

Christopher C. Davis, Bowie, MD (US);

Assignee:

University of Maryland, College Park, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/58 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a sensor system, an active sensor chip includes an array of periodically-patterned dielectric active sensor patches of different periodicities and geometries formed on a metal film. A specimen under study is positioned on each patch, and the active sensor chip is interrogated by illumination the patches in a predetermined sequence to result in a fluorescence response from each patch enhanced by SPP. The intensity of the fluorescence response is controlled by varying the wavelength, incidence angle, azimuthal orientation and polarization direction of the excitation light beam as the function of the periodicity of the illuminated patch. The system is compatible with commercial fluorescence microscopes and scanned laser interrogation systems.


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