The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2011
Filed:
Jul. 20, 2007
Takashi Kasai, Kyoto, JP;
Yasuhiro Horimoto, Kyoto, JP;
Fumihito Kato, Kyoto, JP;
Masaki Munechika, Kyoto, JP;
Shuichi Wakabayashi, Kyoto, JP;
Toshiyuki Takahashi, Kyoto, JP;
Masayuki Inuga, Kyoto, JP;
Takashi Kasai, Kyoto, JP;
Yasuhiro Horimoto, Kyoto, JP;
Fumihito Kato, Kyoto, JP;
Masaki Munechika, Kyoto, JP;
Shuichi Wakabayashi, Kyoto, JP;
Toshiyuki Takahashi, Kyoto, JP;
Masayuki Inuga, Kyoto, JP;
OMRON Corporation, Kyoto, JP;
Abstract
A method for manufacturing a vibration sensor including forming a sacrifice layer at one part of a front surface of a semiconductor substrate of monocrystalline silicon with a material isotropically etched by an etchant for etching the semiconductor substrate, forming a thin film protective film with a material having resistance to the etchant on the sacrifice layer and the front surface of the semiconductor substrate at a periphery of the sacrifice layer, forming a thin film of monocrystalline silicon, polycrystalline silicon, or amorphous silicon on an upper side of the sacrifice layer, opening a backside etching window in a back surface protective film having resistance to the etchant for etching the semiconductor substrate formed on a back surface of the semiconductor substrate, forming a through-hole in the semiconductor substrate by etching the semiconductor substrate anisotropically by using crystal-oriented etching by applying the etchant from the back surface window, then etching the sacrifice layer isotropically by the etchant after the etchant reaches the front surface of the semiconductor substrate, and then etching the semiconductor substrate anisotropically by using crystal-oriented etching from a front side by the etchant spread to a space formed after the sacrifice layer is removed, and forming a holder for supporting the thin film on an upper surface of the semiconductor substrate by removing the thin film protective film partially.