The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2011
Filed:
Nov. 21, 2003
Applicants:
Ning Wei, Roswell, GA (US);
Rameshbabu Boga, Roswell, GA (US);
Inventors:
Ning Wei, Roswell, GA (US);
Rameshbabu Boga, Roswell, GA (US);
Assignee:
Kimberly-Clark Worldwide, Inc., Neenah, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract
A flow-through assay device for detecting the presence or quantity of an analyte residing in a test sample is provided. The device utilizes multiple detection zones, one of which is premised on 'competitive' binding of the analyte and the other is premised on 'sandwich' binding of the analyte. The present inventors believe that the combination of these zones may enable the detection of an analyte over extended concentration ranges.