The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2011
Filed:
Feb. 03, 2004
Applicants:
Martin H. Teicher, Rye, NH (US);
Steven B. Lowen, Burlington, MA (US);
Inventors:
Martin H. Teicher, Rye, NH (US);
Steven B. Lowen, Burlington, MA (US);
Assignee:
The McLean Hospital Corporation, Belmont, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention provides methods for determining shifts in the attentional state of a subject. These methods are useful for diagnosing subjects with a psychological or behavioral disorder. The invention also features methods for determining the effect of a therapy on the overall attentional state and shifts in the attentional state of a subject.
Teicher, Martin. (2011). Method for determining fluctuation in attentional state and overall attentional state (U.S. Patent No. 7942828). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7942828
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile